Control chart for half normal and half exponential power distributed process

In this manuscript, we construct an attribute control chart (ACC) for the number of defective items using time-truncated life tests (TTLT) when the lifetime of a manufacturing item follows two lifetime data distributions: the half-normal distribution (HND) and the half-exponential power distribution...

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Detalles Bibliográficos
Autores principales: Naveed, Muhammad, Azam, Muhammad, Khan, Nasrullah, Aslam, Muhammad, Saleem, Muhammad, Saeed, Muhammad
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10224995/
https://www.ncbi.nlm.nih.gov/pubmed/37244949
http://dx.doi.org/10.1038/s41598-023-35884-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10224995/
https://www.ncbi.nlm.nih.gov/pubmed/37244949
http://dx.doi.org/10.1038/s41598-023-35884-0

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