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Control chart for half normal and half exponential power distributed process
In this manuscript, we construct an attribute control chart (ACC) for the number of defective items using time-truncated life tests (TTLT) when the lifetime of a manufacturing item follows two lifetime data distributions: the half-normal distribution (HND) and the half-exponential power distribution...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10224995/ https://www.ncbi.nlm.nih.gov/pubmed/37244949 http://dx.doi.org/10.1038/s41598-023-35884-0 |