Synchronization of scanning probe and pixelated sensor for image-guided diffraction microscopy

A 4-dimensional modality of a scanning transmission electron microscope (4D-STEM) acquires diffraction images formed by a coherent and focused electron beam scanning the specimen. Newly developed ultrafast detectors offer a possibility to acquire high throughput diffraction patterns at each pixel of...

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Detalles Bibliográficos
Autores principales: Seifer, Shahar, Elbaum, Michael
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2023
Materias:
Hardware Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10245099/
https://www.ncbi.nlm.nih.gov/pubmed/37293572
http://dx.doi.org/10.1016/j.ohx.2023.e00431

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10245099/
https://www.ncbi.nlm.nih.gov/pubmed/37293572
http://dx.doi.org/10.1016/j.ohx.2023.e00431

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