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Synchronization of scanning probe and pixelated sensor for image-guided diffraction microscopy
A 4-dimensional modality of a scanning transmission electron microscope (4D-STEM) acquires diffraction images formed by a coherent and focused electron beam scanning the specimen. Newly developed ultrafast detectors offer a possibility to acquire high throughput diffraction patterns at each pixel of...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10245099/ https://www.ncbi.nlm.nih.gov/pubmed/37293572 http://dx.doi.org/10.1016/j.ohx.2023.e00431 |