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Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET

FinFET devices and Silicon-On-Insulator (SOI) devices are two mainstream technical routes after the planar MOSFET reached the limit for scaling. The SOI FinFET devices combine the benefits of FinFET and SOI devices, which can be further boosted by SiGe channels. In this work, we develop an optimizin...

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Detalles Bibliográficos
Autores principales: Li, Shixin, Wu, Zhenhua
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10254321/
https://www.ncbi.nlm.nih.gov/pubmed/37299612
http://dx.doi.org/10.3390/nano13111709
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author Li, Shixin
Wu, Zhenhua
author_facet Li, Shixin
Wu, Zhenhua
author_sort Li, Shixin
collection PubMed
description FinFET devices and Silicon-On-Insulator (SOI) devices are two mainstream technical routes after the planar MOSFET reached the limit for scaling. The SOI FinFET devices combine the benefits of FinFET and SOI devices, which can be further boosted by SiGe channels. In this work, we develop an optimizing strategy of the Ge fraction in SiGe Channels of SGOI FinFET devices. The simulation results of ring oscillator (RO) circuits and SRAM cells reveal that altering the Ge fraction can improve the performance and power of different circuits for different applications.
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spelling pubmed-102543212023-06-10 Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET Li, Shixin Wu, Zhenhua Nanomaterials (Basel) Article FinFET devices and Silicon-On-Insulator (SOI) devices are two mainstream technical routes after the planar MOSFET reached the limit for scaling. The SOI FinFET devices combine the benefits of FinFET and SOI devices, which can be further boosted by SiGe channels. In this work, we develop an optimizing strategy of the Ge fraction in SiGe Channels of SGOI FinFET devices. The simulation results of ring oscillator (RO) circuits and SRAM cells reveal that altering the Ge fraction can improve the performance and power of different circuits for different applications. MDPI 2023-05-23 /pmc/articles/PMC10254321/ /pubmed/37299612 http://dx.doi.org/10.3390/nano13111709 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Li, Shixin
Wu, Zhenhua
Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET
title Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET
title_full Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET
title_fullStr Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET
title_full_unstemmed Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET
title_short Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET
title_sort design technology co-optimization strategy for ge fraction in sige channel of sgoi finfet
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10254321/
https://www.ncbi.nlm.nih.gov/pubmed/37299612
http://dx.doi.org/10.3390/nano13111709
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