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Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET
FinFET devices and Silicon-On-Insulator (SOI) devices are two mainstream technical routes after the planar MOSFET reached the limit for scaling. The SOI FinFET devices combine the benefits of FinFET and SOI devices, which can be further boosted by SiGe channels. In this work, we develop an optimizin...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10254321/ https://www.ncbi.nlm.nih.gov/pubmed/37299612 http://dx.doi.org/10.3390/nano13111709 |
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author | Li, Shixin Wu, Zhenhua |
author_facet | Li, Shixin Wu, Zhenhua |
author_sort | Li, Shixin |
collection | PubMed |
description | FinFET devices and Silicon-On-Insulator (SOI) devices are two mainstream technical routes after the planar MOSFET reached the limit for scaling. The SOI FinFET devices combine the benefits of FinFET and SOI devices, which can be further boosted by SiGe channels. In this work, we develop an optimizing strategy of the Ge fraction in SiGe Channels of SGOI FinFET devices. The simulation results of ring oscillator (RO) circuits and SRAM cells reveal that altering the Ge fraction can improve the performance and power of different circuits for different applications. |
format | Online Article Text |
id | pubmed-10254321 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-102543212023-06-10 Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET Li, Shixin Wu, Zhenhua Nanomaterials (Basel) Article FinFET devices and Silicon-On-Insulator (SOI) devices are two mainstream technical routes after the planar MOSFET reached the limit for scaling. The SOI FinFET devices combine the benefits of FinFET and SOI devices, which can be further boosted by SiGe channels. In this work, we develop an optimizing strategy of the Ge fraction in SiGe Channels of SGOI FinFET devices. The simulation results of ring oscillator (RO) circuits and SRAM cells reveal that altering the Ge fraction can improve the performance and power of different circuits for different applications. MDPI 2023-05-23 /pmc/articles/PMC10254321/ /pubmed/37299612 http://dx.doi.org/10.3390/nano13111709 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Li, Shixin Wu, Zhenhua Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET |
title | Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET |
title_full | Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET |
title_fullStr | Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET |
title_full_unstemmed | Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET |
title_short | Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET |
title_sort | design technology co-optimization strategy for ge fraction in sige channel of sgoi finfet |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10254321/ https://www.ncbi.nlm.nih.gov/pubmed/37299612 http://dx.doi.org/10.3390/nano13111709 |
work_keys_str_mv | AT lishixin designtechnologycooptimizationstrategyforgefractioninsigechannelofsgoifinfet AT wuzhenhua designtechnologycooptimizationstrategyforgefractioninsigechannelofsgoifinfet |