Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

Multilayer III–V-based solar cells are complex devices consisting of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. In this work, we apply frequency-modulated Kelvin probe force microscopy under a...

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Detalles Bibliográficos
Autores principales: da Lisca, Mattia, Alvarez, José, Connolly, James P, Vaissiere, Nicolas, Mekhazni, Karim, Decobert, Jean, Kleider, Jean-Paul
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2023
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10280077/
https://www.ncbi.nlm.nih.gov/pubmed/37346784
http://dx.doi.org/10.3762/bjnano.14.59

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10280077/
https://www.ncbi.nlm.nih.gov/pubmed/37346784
http://dx.doi.org/10.3762/bjnano.14.59

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