Central Line Infections in U.S. Hospitals: An exploration of variation in central line device days and infection rates across hospitals that serve highly complex patient populations

Detalles Bibliográficos
Autores principales: Hefner, Jennifer L., Fareed, Naleef, Walker, Daniel M., Huerta, Timothy R., McAlearney, Ann Scheck
Formato: Online Artículo Texto
Lenguaje:English
Publicado: 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10288527/
https://www.ncbi.nlm.nih.gov/pubmed/30638670
http://dx.doi.org/10.1016/j.ajic.2018.12.001

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10288527/
https://www.ncbi.nlm.nih.gov/pubmed/30638670
http://dx.doi.org/10.1016/j.ajic.2018.12.001

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