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Central Line Infections in U.S. Hospitals: An exploration of variation in central line device days and infection rates across hospitals that serve highly complex patient populations
Autores principales: | Hefner, Jennifer L., Fareed, Naleef, Walker, Daniel M., Huerta, Timothy R., McAlearney, Ann Scheck |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10288527/ https://www.ncbi.nlm.nih.gov/pubmed/30638670 http://dx.doi.org/10.1016/j.ajic.2018.12.001 |
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