Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol

This work deals with the characteristics of highly segmented double-sided silicon detectors. These are fundamental parts in many new state-of-the-art particle detection systems, and therefore they must perform optimally. We propose a test bench that can handle 256 electronic channels with off-the-sh...

Descripción completa

Detalles Bibliográficos
Autores principales: Dueñas, J. A., Cobo, A., López, L., Galtarossa, F., Goasduff, A., Mengoni, D., Sánchez-Benítez, A. M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10300734/
https://www.ncbi.nlm.nih.gov/pubmed/37420550
http://dx.doi.org/10.3390/s23125384

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10300734/
https://www.ncbi.nlm.nih.gov/pubmed/37420550
http://dx.doi.org/10.3390/s23125384

Ejemplares similares