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An Experimental Study of Dislocation Dynamics in GaN

The dynamics of dislocations introduced through indentation or scratching at room temperature into a few GaN layers that were grown using the HVPE, MOCVD and ELOG methods and had different dislocation densities were studied via the electron-beam-induced current and cathodoluminescence methods. The e...

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Detalles Bibliográficos
Autores principales: Yakimov, Eugene B., Kulanchikov, Yury O., Vergeles, Pavel S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10303180/
https://www.ncbi.nlm.nih.gov/pubmed/37374774
http://dx.doi.org/10.3390/mi14061190