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Imaging beyond the surface region: Probing hidden materials via atomic force microscopy
Probing material properties at surfaces down to the single-particle scale of atoms and molecules has been achieved, but high-resolution subsurface imaging remains a nanometrology challenge due to electromagnetic and acoustic dispersion and diffraction. The atomically sharp probe used in scanning pro...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Association for the Advancement of Science
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10306303/ https://www.ncbi.nlm.nih.gov/pubmed/37379392 http://dx.doi.org/10.1126/sciadv.adg8292 |