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Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications
| Formato: | Online Artículo Texto |
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| Lenguaje: | English |
| Publicado: |
Public Library of Science
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10310016/ https://www.ncbi.nlm.nih.gov/pubmed/37384720 http://dx.doi.org/10.1371/journal.pone.0288213 |