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Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications
| Formato: | Online Artículo Texto |
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| Lenguaje: | English |
| Publicado: |
Public Library of Science
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10310016/ https://www.ncbi.nlm.nih.gov/pubmed/37384720 http://dx.doi.org/10.1371/journal.pone.0288213 |
| _version_ | 1785066497313341440 |
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| collection | PubMed |
| description | |
| format | Online Article Text |
| id | pubmed-10310016 |
| institution | National Center for Biotechnology Information |
| language | English |
| publishDate | 2023 |
| publisher | Public Library of Science |
| record_format | MEDLINE/PubMed |
| spelling | pubmed-103100162023-06-30 Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications PLoS One Expression of Concern Public Library of Science 2023-06-29 /pmc/articles/PMC10310016/ /pubmed/37384720 http://dx.doi.org/10.1371/journal.pone.0288213 Text en © 2023 The PLOS ONE Editors https://creativecommons.org/licenses/by/4.0/This is an open access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0/) , which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited. |
| spellingShingle | Expression of Concern Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications |
| title | Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications |
| title_full | Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications |
| title_fullStr | Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications |
| title_full_unstemmed | Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications |
| title_short | Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications |
| title_sort | expression of concern: electrical study of trapped charges in copper-doped zinc oxide films by scanning probe microscopy for nonvolatile memory applications |
| topic | Expression of Concern |
| url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10310016/ https://www.ncbi.nlm.nih.gov/pubmed/37384720 http://dx.doi.org/10.1371/journal.pone.0288213 |
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