DeepCLEM: automated registration for correlative light and electron microscopy using deep learning

In correlative light and electron microscopy (CLEM), the fluorescent images must be registered to the EM images with high precision. Due to the different contrast of EM and fluorescence images, automated correlation-based alignment is not directly possible, and registration is often done by hand usi...

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Detalles Bibliográficos
Autores principales: Seifert, Rick, Markert, Sebastian M., Britz, Sebastian, Perschin, Veronika, Erbacher, Christoph, Stigloher, Christian, Kollmannsberger, Philip
Formato: Online Artículo Texto
Lenguaje:English
Publicado: F1000 Research Limited 2022
Materias:
Software Tool Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10311120/
https://www.ncbi.nlm.nih.gov/pubmed/37397873
http://dx.doi.org/10.12688/f1000research.27158.2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10311120/
https://www.ncbi.nlm.nih.gov/pubmed/37397873
http://dx.doi.org/10.12688/f1000research.27158.2

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