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DeepCLEM: automated registration for correlative light and electron microscopy using deep learning
In correlative light and electron microscopy (CLEM), the fluorescent images must be registered to the EM images with high precision. Due to the different contrast of EM and fluorescence images, automated correlation-based alignment is not directly possible, and registration is often done by hand usi...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
F1000 Research Limited
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10311120/ https://www.ncbi.nlm.nih.gov/pubmed/37397873 http://dx.doi.org/10.12688/f1000research.27158.2 |