Fast Twist Angle Mapping of Bilayer Graphene Using Spectroscopic Ellipsometric Contrast Microscopy

[Image: see text] Twisted bilayer graphene provides an ideal solid-state model to explore correlated material properties and opportunities for a variety of optoelectronic applications, but reliable, fast characterization of the twist angle remains a challenge. Here we introduce spectroscopic ellipso...

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Detalles Bibliográficos
Autores principales: Potočnik, Teja, Burton, Oliver, Reutzel, Marcel, Schmitt, David, Bange, Jan Philipp, Mathias, Stefan, Geisenhof, Fabian R., Weitz, R. Thomas, Xin, Linyuan, Joyce, Hannah J., Hofmann, Stephan, Alexander-Webber, Jack A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10311600/
https://www.ncbi.nlm.nih.gov/pubmed/37289669
http://dx.doi.org/10.1021/acs.nanolett.3c00619

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10311600/
https://www.ncbi.nlm.nih.gov/pubmed/37289669
http://dx.doi.org/10.1021/acs.nanolett.3c00619

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