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Fast Twist Angle Mapping of Bilayer Graphene Using Spectroscopic Ellipsometric Contrast Microscopy
[Image: see text] Twisted bilayer graphene provides an ideal solid-state model to explore correlated material properties and opportunities for a variety of optoelectronic applications, but reliable, fast characterization of the twist angle remains a challenge. Here we introduce spectroscopic ellipso...
Autores principales: | Potočnik, Teja, Burton, Oliver, Reutzel, Marcel, Schmitt, David, Bange, Jan Philipp, Mathias, Stefan, Geisenhof, Fabian R., Weitz, R. Thomas, Xin, Linyuan, Joyce, Hannah J., Hofmann, Stephan, Alexander-Webber, Jack A. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2023
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10311600/ https://www.ncbi.nlm.nih.gov/pubmed/37289669 http://dx.doi.org/10.1021/acs.nanolett.3c00619 |
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