Cargando…
New benchmarks in the modelling of X-ray atomic form factors
Analytical representations of X-ray atomic form factor data have been determined. The original data, f (0)(s;Z), are reproduced to a high degree of accuracy. The mean absolute errors calculated for all s = sin θ/λ and Z values in question are primarily determined by the precision of the published da...
| Autor principal: | |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2023
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10317139/ https://www.ncbi.nlm.nih.gov/pubmed/37265051 http://dx.doi.org/10.1107/S2053273323003996 |