Effects of Hot Pixels on Pixel Performance on Backside Illuminated Complementary Metal Oxide Semiconductor (CMOS) Image Sensors

Effects of hot pixels on pixel performance in light and dark environments have been investigated in pinned photodiode 0.18 μm backside illuminated CMOS image sensors irradiated by 10 MeV protons. After exposure to protons, hot pixels and normal pixels are selected from the whole pixel array, and the...

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Detalles Bibliográficos
Autores principales: Liu, Bingkai, Li, Yudong, Wen, Lin, Zhang, Xiang, Guo, Qi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10346500/
https://www.ncbi.nlm.nih.gov/pubmed/37448008
http://dx.doi.org/10.3390/s23136159

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10346500/
https://www.ncbi.nlm.nih.gov/pubmed/37448008
http://dx.doi.org/10.3390/s23136159

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