Deducing the internal interfaces of twisted multilayer graphene via moiré-regulated surface conductivity

The stacking state of atomic layers critically determines the physical properties of twisted van der Waals materials. Unfortunately, precise characterization of the stacked interfaces remains a great challenge as they are buried internally. With conductive atomic force microscopy, we show that the m...

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Detalles Bibliográficos
Autores principales: Wang, Huan, Wang, Sen, Zhang, Shuai, Zhu, Mengzhen, Ouyang, Wengen, Li, Qunyang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2023
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10361741/
https://www.ncbi.nlm.nih.gov/pubmed/37484999
http://dx.doi.org/10.1093/nsr/nwad175

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10361741/
https://www.ncbi.nlm.nih.gov/pubmed/37484999
http://dx.doi.org/10.1093/nsr/nwad175

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