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Deducing the internal interfaces of twisted multilayer graphene via moiré-regulated surface conductivity
The stacking state of atomic layers critically determines the physical properties of twisted van der Waals materials. Unfortunately, precise characterization of the stacked interfaces remains a great challenge as they are buried internally. With conductive atomic force microscopy, we show that the m...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Oxford University Press
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10361741/ https://www.ncbi.nlm.nih.gov/pubmed/37484999 http://dx.doi.org/10.1093/nsr/nwad175 |