An avalanche-and-surge robust ultrawide-bandgap heterojunction for power electronics

Avalanche and surge robustness involve fundamental carrier dynamics under high electric field and current density. They are also prerequisites of any power device to survive common overvoltage and overcurrent stresses in power electronics applications such as electric vehicles, electricity grids, an...

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Detalles Bibliográficos
Autores principales: Zhou, Feng, Gong, Hehe, Xiao, Ming, Ma, Yunwei, Wang, Zhengpeng, Yu, Xinxin, Li, Li, Fu, Lan, Tan, Hark Hoe, Yang, Yi, Ren, Fang-Fang, Gu, Shulin, Zheng, Youdou, Lu, Hai, Zhang, Rong, Zhang, Yuhao, Ye, Jiandong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10368629/
https://www.ncbi.nlm.nih.gov/pubmed/37491528
http://dx.doi.org/10.1038/s41467-023-40194-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10368629/
https://www.ncbi.nlm.nih.gov/pubmed/37491528
http://dx.doi.org/10.1038/s41467-023-40194-0

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