Automation of an atomic force microscope via Arduino

The Atomic Force Microscopy is a very versatile technique that allows to characterize surfaces by acquiring topographies with sub-nanometer resolution. This technique often overcomes the problems and capabilities of electron microscopy when characterizing few nanometers thin coatings over solid subs...

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Detalles Bibliográficos
Autores principales: Guerrero-Felix, Jesus Gerardo, Lopez-Miras, Javier, Rodriguez-Valverde, Miguel Angel, Moraila-Martinez, Carmen Lucia, Fernandez-Rodriguez, Miguel Angel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10372894/
https://www.ncbi.nlm.nih.gov/pubmed/37521147
http://dx.doi.org/10.1016/j.ohx.2023.e00447

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10372894/
https://www.ncbi.nlm.nih.gov/pubmed/37521147
http://dx.doi.org/10.1016/j.ohx.2023.e00447

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