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Analysis of the Lifetime of Neural Implants Using In Vitro Test Structures
The aim of this work was to measure the lifetime of neural implant test samples at two different temperatures, using a method that allows the precise measurement of the sample lifetime, further analysis with the use of Weibull statistics, and examination of the applicability of the Van’t Hoff rule....
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10385412/ https://www.ncbi.nlm.nih.gov/pubmed/37514558 http://dx.doi.org/10.3390/s23146263 |