Three-dimensional micro-X-ray topography using focused sheet-shaped X-ray beam

X-ray topography is a powerful method for analyzing crystal defects and strain in crystalline materials non-destructively. However, conventional X-ray topography uses simple X-ray diffraction images, which means depth information on defects and dislocations cannot be obtained. We have therefor devel...

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Detalles Bibliográficos
Autores principales: Yoneyama, Akio, Ishiji, Kotaro, Sakaki, Atsushi, Kobayashi, Yutaka, Inaba, Masayuki, Fukuda, Kazunori, Konishi, Kumiko, Shima, Akio, Takamatsu, Daiko
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10390543/
https://www.ncbi.nlm.nih.gov/pubmed/37524763
http://dx.doi.org/10.1038/s41598-023-39347-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10390543/
https://www.ncbi.nlm.nih.gov/pubmed/37524763
http://dx.doi.org/10.1038/s41598-023-39347-4

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