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Three-dimensional micro-X-ray topography using focused sheet-shaped X-ray beam
X-ray topography is a powerful method for analyzing crystal defects and strain in crystalline materials non-destructively. However, conventional X-ray topography uses simple X-ray diffraction images, which means depth information on defects and dislocations cannot be obtained. We have therefor devel...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10390543/ https://www.ncbi.nlm.nih.gov/pubmed/37524763 http://dx.doi.org/10.1038/s41598-023-39347-4 |