Exploring the influence of focused ion beam processing and scanning electron microscopy imaging on solid-state electrolytes

Performing reliable preparation of transmission electron microscopy (TEM) samples is the necessary basis for a meaningful investigation by ex situ and even more so by in situ TEM techniques, but it is challenging using materials that are sensitive to electron beam irradiation. Focused ion beam is cu...

Descripción completa

Detalles Bibliográficos
Autores principales: Ding, Ziming, Tang, Yushu, Chakravadhanula, Venkata Sai Kiran, Ma, Qianli, Tietz, Frank, Dai, Yuting, Scherer, Torsten, Kübel, Christian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10402911/
https://www.ncbi.nlm.nih.gov/pubmed/36408996
http://dx.doi.org/10.1093/jmicro/dfac064

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10402911/
https://www.ncbi.nlm.nih.gov/pubmed/36408996
http://dx.doi.org/10.1093/jmicro/dfac064

Ejemplares similares