Chip-based in situ TEM investigation of structural thermal instability in aged layered cathode

Thermally induced oxygen release is an intrinsic structural instability in layered cathodes, which causes thermal runaway issues and becomes increasingly critical with the continuous improvement in energy density. Furthermore, thermal runaway events always occur in electrochemically aged cathodes, w...

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Detalles Bibliográficos
Autores principales: Wang, Yuhan, Yuan, Yuan, Liao, Xiaobin, Van Tendeloo, Gustaaf, Zhao, Yan, Sun, Congli
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2023
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10408578/
https://www.ncbi.nlm.nih.gov/pubmed/37560427
http://dx.doi.org/10.1039/d3na00201b

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10408578/
https://www.ncbi.nlm.nih.gov/pubmed/37560427
http://dx.doi.org/10.1039/d3na00201b

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