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Effect of Thermal Aging on the Interfacial Reaction Behavior and Failure Mechanism of Ni-xCu/Sn Soldering Joints under Shear Loading

Ni-xCu/Sn soldering joints were aged at 200 °C, and the microstructure evolution and mechanical properties during the solid-state reaction were studied under shear loading. Results showed that the intermetallic compounds (IMCs) exhibited a Cu content-dependent transformation from the (Ni,Cu)(3)Sn(4)...

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Autores principales: Li, Zhigang, Cheng, Kai, Liu, Jiajun, He, Yigang, Xiao, Yong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10420103/
https://www.ncbi.nlm.nih.gov/pubmed/37569956
http://dx.doi.org/10.3390/ma16155253
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author Li, Zhigang
Cheng, Kai
Liu, Jiajun
He, Yigang
Xiao, Yong
author_facet Li, Zhigang
Cheng, Kai
Liu, Jiajun
He, Yigang
Xiao, Yong
author_sort Li, Zhigang
collection PubMed
description Ni-xCu/Sn soldering joints were aged at 200 °C, and the microstructure evolution and mechanical properties during the solid-state reaction were studied under shear loading. Results showed that the intermetallic compounds (IMCs) exhibited a Cu content-dependent transformation from the (Ni,Cu)(3)Sn(4) phase to the (Cu,Ni)(6)Sn(5) phase at the Ni-xCu/Sn interface. Furthermore, a Cu(3)Sn layer was observed exclusively at the Cu/Sn interface. The shear strength of the soldering joints after thermal aging exhibited an initial decrease followed by an increase, except for a significant enhancement at the Cu content of 60 wt.%. In addition, the evolution law of mechanical properties and failure mechanism of the thermal aging joints were elucidated based on the fracture microstructure and the fracture curve of the joints.
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spelling pubmed-104201032023-08-12 Effect of Thermal Aging on the Interfacial Reaction Behavior and Failure Mechanism of Ni-xCu/Sn Soldering Joints under Shear Loading Li, Zhigang Cheng, Kai Liu, Jiajun He, Yigang Xiao, Yong Materials (Basel) Article Ni-xCu/Sn soldering joints were aged at 200 °C, and the microstructure evolution and mechanical properties during the solid-state reaction were studied under shear loading. Results showed that the intermetallic compounds (IMCs) exhibited a Cu content-dependent transformation from the (Ni,Cu)(3)Sn(4) phase to the (Cu,Ni)(6)Sn(5) phase at the Ni-xCu/Sn interface. Furthermore, a Cu(3)Sn layer was observed exclusively at the Cu/Sn interface. The shear strength of the soldering joints after thermal aging exhibited an initial decrease followed by an increase, except for a significant enhancement at the Cu content of 60 wt.%. In addition, the evolution law of mechanical properties and failure mechanism of the thermal aging joints were elucidated based on the fracture microstructure and the fracture curve of the joints. MDPI 2023-07-26 /pmc/articles/PMC10420103/ /pubmed/37569956 http://dx.doi.org/10.3390/ma16155253 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Li, Zhigang
Cheng, Kai
Liu, Jiajun
He, Yigang
Xiao, Yong
Effect of Thermal Aging on the Interfacial Reaction Behavior and Failure Mechanism of Ni-xCu/Sn Soldering Joints under Shear Loading
title Effect of Thermal Aging on the Interfacial Reaction Behavior and Failure Mechanism of Ni-xCu/Sn Soldering Joints under Shear Loading
title_full Effect of Thermal Aging on the Interfacial Reaction Behavior and Failure Mechanism of Ni-xCu/Sn Soldering Joints under Shear Loading
title_fullStr Effect of Thermal Aging on the Interfacial Reaction Behavior and Failure Mechanism of Ni-xCu/Sn Soldering Joints under Shear Loading
title_full_unstemmed Effect of Thermal Aging on the Interfacial Reaction Behavior and Failure Mechanism of Ni-xCu/Sn Soldering Joints under Shear Loading
title_short Effect of Thermal Aging on the Interfacial Reaction Behavior and Failure Mechanism of Ni-xCu/Sn Soldering Joints under Shear Loading
title_sort effect of thermal aging on the interfacial reaction behavior and failure mechanism of ni-xcu/sn soldering joints under shear loading
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10420103/
https://www.ncbi.nlm.nih.gov/pubmed/37569956
http://dx.doi.org/10.3390/ma16155253
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