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Reducing Bonding Temperature and Energy Consumption in Electronic Packaging Using Flash Electro-Thermal Carbon Fiber Heating Elements
[Image: see text] Semiconductor packaging based on an epoxy molding compound (EMC) currently has several disadvantages including warpage, limited processing area, and variability that all negatively affect cost and production yield. We propose a facile EMC molding process method using a flash electr...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2023
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10436241/ https://www.ncbi.nlm.nih.gov/pubmed/37535803 http://dx.doi.org/10.1021/acsami.3c06145 |
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author | Park, Seong Yeon On, Seung Yoon Kim, Junmo Lee, Jeonyoon Kim, Taek-Soo Wardle, Brian L. Kim, Seong Su |
author_facet | Park, Seong Yeon On, Seung Yoon Kim, Junmo Lee, Jeonyoon Kim, Taek-Soo Wardle, Brian L. Kim, Seong Su |
author_sort | Park, Seong Yeon |
collection | PubMed |
description | [Image: see text] Semiconductor packaging based on an epoxy molding compound (EMC) currently has several disadvantages including warpage, limited processing area, and variability that all negatively affect cost and production yield. We propose a facile EMC molding process method using a flash electro-thermal carbon fiber heating (FE-CH) device based on carbon fiber-based papers to manufacture an EMC molded to a copper substrate (EMC/Cu bi-layer package) via Joule heating, and using this device, a modified cure cycle that combines the conventional cure cycle (CCC) with rapid cooling was performed using FE-CH to reduce the curvature of the EMC/Cu bi-layer package. Compared to the conventional hot press process, which uses 3.17 MW of power, the FE-CH process only uses 32.87 kW, resulting in a power consumption reduction of over 100 times when following the CCC. Furthermore, the FE-CH-cured EMC/Cu bi-layer package exhibits mechanical properties equivalent to those of a hot press-cured specimen, including the degree of cure, elastic modulus, curvature, bonding temperature, residual strain, and peel strength. The modified cure cycle using the FE-CH results in a 31% reduction in residual strain, a 32% reduction in curvature, and a 47% increase in peel strength compared to the CCC, indicating that this new process method is very promising for reducing a semiconductor package’s price by reducing the process cost and warpage. |
format | Online Article Text |
id | pubmed-10436241 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | American Chemical Society |
record_format | MEDLINE/PubMed |
spelling | pubmed-104362412023-08-19 Reducing Bonding Temperature and Energy Consumption in Electronic Packaging Using Flash Electro-Thermal Carbon Fiber Heating Elements Park, Seong Yeon On, Seung Yoon Kim, Junmo Lee, Jeonyoon Kim, Taek-Soo Wardle, Brian L. Kim, Seong Su ACS Appl Mater Interfaces [Image: see text] Semiconductor packaging based on an epoxy molding compound (EMC) currently has several disadvantages including warpage, limited processing area, and variability that all negatively affect cost and production yield. We propose a facile EMC molding process method using a flash electro-thermal carbon fiber heating (FE-CH) device based on carbon fiber-based papers to manufacture an EMC molded to a copper substrate (EMC/Cu bi-layer package) via Joule heating, and using this device, a modified cure cycle that combines the conventional cure cycle (CCC) with rapid cooling was performed using FE-CH to reduce the curvature of the EMC/Cu bi-layer package. Compared to the conventional hot press process, which uses 3.17 MW of power, the FE-CH process only uses 32.87 kW, resulting in a power consumption reduction of over 100 times when following the CCC. Furthermore, the FE-CH-cured EMC/Cu bi-layer package exhibits mechanical properties equivalent to those of a hot press-cured specimen, including the degree of cure, elastic modulus, curvature, bonding temperature, residual strain, and peel strength. The modified cure cycle using the FE-CH results in a 31% reduction in residual strain, a 32% reduction in curvature, and a 47% increase in peel strength compared to the CCC, indicating that this new process method is very promising for reducing a semiconductor package’s price by reducing the process cost and warpage. American Chemical Society 2023-08-03 /pmc/articles/PMC10436241/ /pubmed/37535803 http://dx.doi.org/10.1021/acsami.3c06145 Text en © 2023 The Authors. Published by American Chemical Society https://creativecommons.org/licenses/by-nc-nd/4.0/Permits non-commercial access and re-use, provided that author attribution and integrity are maintained; but does not permit creation of adaptations or other derivative works (https://creativecommons.org/licenses/by-nc-nd/4.0/). |
spellingShingle | Park, Seong Yeon On, Seung Yoon Kim, Junmo Lee, Jeonyoon Kim, Taek-Soo Wardle, Brian L. Kim, Seong Su Reducing Bonding Temperature and Energy Consumption in Electronic Packaging Using Flash Electro-Thermal Carbon Fiber Heating Elements |
title | Reducing Bonding
Temperature and Energy Consumption
in Electronic Packaging Using Flash Electro-Thermal Carbon Fiber Heating
Elements |
title_full | Reducing Bonding
Temperature and Energy Consumption
in Electronic Packaging Using Flash Electro-Thermal Carbon Fiber Heating
Elements |
title_fullStr | Reducing Bonding
Temperature and Energy Consumption
in Electronic Packaging Using Flash Electro-Thermal Carbon Fiber Heating
Elements |
title_full_unstemmed | Reducing Bonding
Temperature and Energy Consumption
in Electronic Packaging Using Flash Electro-Thermal Carbon Fiber Heating
Elements |
title_short | Reducing Bonding
Temperature and Energy Consumption
in Electronic Packaging Using Flash Electro-Thermal Carbon Fiber Heating
Elements |
title_sort | reducing bonding
temperature and energy consumption
in electronic packaging using flash electro-thermal carbon fiber heating
elements |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10436241/ https://www.ncbi.nlm.nih.gov/pubmed/37535803 http://dx.doi.org/10.1021/acsami.3c06145 |
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