Scanning electron microscopic analysis of adherent bacterial biofilms associated with peri‐implantitis

OBJECTIVES: Peri‐implantitis (PI) is caused by bacteria in the peri‐implant space but the consensus on microbial profile is still lacking. Current microbial sampling of PI lesions has largely focused on analyzing bacterial species that have been shed from the implant surface and captured in the pock...

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Detalles Bibliográficos
Autores principales: Chang, Jae W., Bi, Jiarui, Owen, Gethin, Shen, Ya, Haapasalo, Markus, Wiebe, Colin, Tarzemany, Rana, Larjava, Hannu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2023
Materias:
Original Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10441592/
https://www.ncbi.nlm.nih.gov/pubmed/37157917
http://dx.doi.org/10.1002/cre2.741

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10441592/
https://www.ncbi.nlm.nih.gov/pubmed/37157917
http://dx.doi.org/10.1002/cre2.741

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