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KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements

The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicate...

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Detalles Bibliográficos
Autores principales: Montecchi, Marco, Mittiga, Alberto, Malerba, Claudia, Menchini, Francesca
Formato: Online Artículo Texto
Lenguaje:English
Publicado: F1000 Research Limited 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10446058/
https://www.ncbi.nlm.nih.gov/pubmed/37645208
http://dx.doi.org/10.12688/openreseurope.13842.2