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KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements
The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicate...
Autores principales: | Montecchi, Marco, Mittiga, Alberto, Malerba, Claudia, Menchini, Francesca |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
F1000 Research Limited
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10446058/ https://www.ncbi.nlm.nih.gov/pubmed/37645208 http://dx.doi.org/10.12688/openreseurope.13842.2 |
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