Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements

One of the threats to nanometric CMOS analog circuit reliability is circuit performance degradation due to transistor aging. To extend circuit operating life, the bias of the main devices within the circuit must be adjusted while the aging degradation process affects them by using a monitor circuit...

Descripción completa

Detalles Bibliográficos
Autores principales: Altet, Josep, Aragones, Xavier, Barajas, Enrique, Gisbert, Xavier, Martínez, Sergio, Mateo, Diego
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10459815/
https://www.ncbi.nlm.nih.gov/pubmed/37631605
http://dx.doi.org/10.3390/s23167069

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10459815/
https://www.ncbi.nlm.nih.gov/pubmed/37631605
http://dx.doi.org/10.3390/s23167069

Ejemplares similares