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Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements
One of the threats to nanometric CMOS analog circuit reliability is circuit performance degradation due to transistor aging. To extend circuit operating life, the bias of the main devices within the circuit must be adjusted while the aging degradation process affects them by using a monitor circuit...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10459815/ https://www.ncbi.nlm.nih.gov/pubmed/37631605 http://dx.doi.org/10.3390/s23167069 |