A deep learning-based stripe self-correction method for stitched microscopic images

Stitched fluorescence microscope images inevitably exist in various types of stripes or artifacts caused by uncertain factors such as optical devices or specimens, which severely affects the image quality and downstream quantitative analysis. Here, we present a deep learning-based Stripe Self-Correc...

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Detalles Bibliográficos
Autores principales: Wang, Shu, Liu, Xiaoxiang, Li, Yueying, Sun, Xinquan, Li, Qi, She, Yinhua, Xu, Yixuan, Huang, Xingxin, Lin, Ruolan, Kang, Deyong, Wang, Xingfu, Tu, Haohua, Liu, Wenxi, Huang, Feng, Chen, Jianxin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10480181/
https://www.ncbi.nlm.nih.gov/pubmed/37669977
http://dx.doi.org/10.1038/s41467-023-41165-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10480181/
https://www.ncbi.nlm.nih.gov/pubmed/37669977
http://dx.doi.org/10.1038/s41467-023-41165-1

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