Measuring picometre-level displacements using speckle patterns produced by an integrating sphere

As the fields of optical microscopy, semiconductor technology and fundamental science increasingly aim for precision at or below the nanoscale, there is a burgeoning demand for sub-nanometric displacement and position sensing. We show that the speckle patterns produced by multiple reflections of lig...

Descripción completa

Detalles Bibliográficos
Autores principales: Facchin, Morgan, Bruce, Graham D., Dholakia, Kishan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10480476/
https://www.ncbi.nlm.nih.gov/pubmed/37670047
http://dx.doi.org/10.1038/s41598-023-40518-6

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10480476/
https://www.ncbi.nlm.nih.gov/pubmed/37670047
http://dx.doi.org/10.1038/s41598-023-40518-6

Ejemplares similares