Advances in Focused Ion Beam Tomography for Three-Dimensional Characterization in Materials Science

Over the years, FIB-SEM tomography has become an extremely important technique for the three-dimensional reconstruction of microscopic structures with nanometric resolution. This paper describes in detail the steps required to perform this analysis, from the experimental setup to the data analysis a...

Descripción completa

Detalles Bibliográficos
Autores principales: Mura, Francesco, Cognigni, Flavio, Ferroni, Matteo, Morandi, Vittorio, Rossi, Marco
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10488958/
https://www.ncbi.nlm.nih.gov/pubmed/37687502
http://dx.doi.org/10.3390/ma16175808

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10488958/
https://www.ncbi.nlm.nih.gov/pubmed/37687502
http://dx.doi.org/10.3390/ma16175808

Ejemplares similares