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Advances in Focused Ion Beam Tomography for Three-Dimensional Characterization in Materials Science
Over the years, FIB-SEM tomography has become an extremely important technique for the three-dimensional reconstruction of microscopic structures with nanometric resolution. This paper describes in detail the steps required to perform this analysis, from the experimental setup to the data analysis a...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10488958/ https://www.ncbi.nlm.nih.gov/pubmed/37687502 http://dx.doi.org/10.3390/ma16175808 |