Transmission Electron Microscopy Peeled Surface Defect of Perovskite Quantum Dots to Improve Crystal Structure

Transmission electron microscopy (TEM) is an excellent characterization method to analyze the size, morphology, crystalline state, and microstructure of perovskite quantum dots (PeQDs). Nevertheless, the electron beam of TEM as an illumination source provides high energy, which causes morphological...

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Detalles Bibliográficos
Autores principales: Yuan, Longfei, Zhou, Taixin, Jin, Fengmin, Liang, Guohong, Liao, Yuxiang, Zhao, Aijuan, Yan, Wenbo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10489022/
https://www.ncbi.nlm.nih.gov/pubmed/37687703
http://dx.doi.org/10.3390/ma16176010

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10489022/
https://www.ncbi.nlm.nih.gov/pubmed/37687703
http://dx.doi.org/10.3390/ma16176010

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