Four-Point Measurement Setup for Correlative Microscopy of Nanowires

The measurement method, which utilizes nanomanipulation of the nanowires onto a specially prepared substrate, was presented. It introduced a four-point resistance measurement setup on a chip suited for scanning probe microscopy measurements, integrating connectors and a nanowire specimen. A study on...

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Detalles Bibliográficos
Autores principales: Pruchnik, Bartosz C., Fidelus, Janusz D., Gacka, Ewelina, Kwoka, Krzysztof, Pruchnik, Julia, Piejko, Adrianna, Usydus, Łukasz, Zaraska, Leszek, Sulka, Grzegorz D., Piasecki, Tomasz, Gotszalk, Teodor P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10490214/
https://www.ncbi.nlm.nih.gov/pubmed/37686959
http://dx.doi.org/10.3390/nano13172451

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10490214/
https://www.ncbi.nlm.nih.gov/pubmed/37686959
http://dx.doi.org/10.3390/nano13172451

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