Simulation of Laser Profilometer Measurements in the Presence of Speckle Using Perlin Noise

In the manufacturing industry, inspection systems play a crucial role in ensuring product quality. High-resolution profilometric sensors have become increasingly popular for inspection due to their ability to provide detailed surface information. However, the development and testing of inspection sy...

Descripción completa

Detalles Bibliográficos
Autores principales: Roos-Hoefgeest, Sara, Roos-Hoefgeest, Mario, Álvarez, Ignacio, González, Rafael C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10490692/
https://www.ncbi.nlm.nih.gov/pubmed/37688081
http://dx.doi.org/10.3390/s23177624

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10490692/
https://www.ncbi.nlm.nih.gov/pubmed/37688081
http://dx.doi.org/10.3390/s23177624

Ejemplares similares