Recent developments in X-ray diffraction/scattering computed tomography for materials science

X-ray diffraction/scattering computed tomography (XDS-CT) methods are a non-destructive class of chemical imaging techniques that have the capacity to provide reconstructions of sample cross-sections with spatially resolved chemical information. While X-ray diffraction CT (XRD-CT) is the most well-e...

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Detalles Bibliográficos
Autores principales: Omori, Naomi E., Bobitan, Antonia D., Vamvakeros, Antonis, Beale, Andrew M., Jacques, Simon D. M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society 2023
Materias:
Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10493554/
https://www.ncbi.nlm.nih.gov/pubmed/37691470
http://dx.doi.org/10.1098/rsta.2022.0350

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10493554/
https://www.ncbi.nlm.nih.gov/pubmed/37691470
http://dx.doi.org/10.1098/rsta.2022.0350

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