High-energy interference-free K-lines synchrotron X-ray fluorescence microscopy of rare earth elements in hyperaccumulator plants

Synchrotron-based micro-X-ray fluorescence analysis (µXRF) is a nondestructive and highly sensitive technique. However, element mapping of rare earth elements (REEs) under standard conditions requires care, since energy-dispersive detectors are not able to differentiate accurately between REEs L-she...

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Detalles Bibliográficos
Autores principales: van der Ent, Antony, Brueckner, Dennis, Spiers, Kathryn M, Falch, Ken Vidar, Falkenberg, Gerald, Layet, Clément, Liu, Wen-Shen, Zheng, Hong-Xiang, Le Jean, Marie, Blaudez, Damien
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2023
Materias:
Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10496025/
https://www.ncbi.nlm.nih.gov/pubmed/37591604
http://dx.doi.org/10.1093/mtomcs/mfad050

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10496025/
https://www.ncbi.nlm.nih.gov/pubmed/37591604
http://dx.doi.org/10.1093/mtomcs/mfad050

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