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ALD-grown two-dimensional TiS(x) metal contacts for MoS(2) field-effect transistors
Metal contacts to MoS(2) field-effect transistors (FETs) play a determinant role in the device electrical characteristics and need to be chosen carefully. Because of the Schottky barrier (SB) and the Fermi level pinning (FLP) effects that occur at the contact/MoS(2) interface, MoS(2) FETs often suff...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
RSC
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10496909/ https://www.ncbi.nlm.nih.gov/pubmed/37705798 http://dx.doi.org/10.1039/d3na00387f |