Simultaneously ultrafast and robust two-dimensional flash memory devices based on phase-engineered edge contacts

As the prevailing non-volatile memory (NVM), flash memory offers mass data storage at high integration density and low cost. However, due to the ‘speed-retention-endurance’ dilemma, their typical speed is limited to ~microseconds to milliseconds for program and erase operations, restricting their ap...

Descripción completa

Detalles Bibliográficos
Autores principales: Yu, Jun, Wang, Han, Zhuge, Fuwei, Chen, Zirui, Hu, Man, Xu, Xiang, He, Yuhui, Ma, Ying, Miao, Xiangshui, Zhai, Tianyou
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10499832/
https://www.ncbi.nlm.nih.gov/pubmed/37704609
http://dx.doi.org/10.1038/s41467-023-41363-x

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10499832/
https://www.ncbi.nlm.nih.gov/pubmed/37704609
http://dx.doi.org/10.1038/s41467-023-41363-x

Ejemplares similares