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Simultaneously ultrafast and robust two-dimensional flash memory devices based on phase-engineered edge contacts
As the prevailing non-volatile memory (NVM), flash memory offers mass data storage at high integration density and low cost. However, due to the ‘speed-retention-endurance’ dilemma, their typical speed is limited to ~microseconds to milliseconds for program and erase operations, restricting their ap...
| Autores principales: | , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10499832/ https://www.ncbi.nlm.nih.gov/pubmed/37704609 http://dx.doi.org/10.1038/s41467-023-41363-x |