Electroencephalography characteristics related to risk of sudden unexpected death in epilepsy in patients with Dravet syndrome

OBJECTIVE: To investigate the quantitative electroencephalography (EEG) features associated with a high risk of sudden unexpected death in epilepsy (SUDEP) in patients with Dravet syndrome (DS). METHODS: Patients with DS and healthy controls (HCs) who underwent EEG were included in the study. EEG si...

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Detalles Bibliográficos
Autores principales: Kim, Jeong-Youn, Shin, Jeongyoon, Kim, Laehyun, Kim, Se Hee
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2023
Materias:
Neurology
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10512954/
https://www.ncbi.nlm.nih.gov/pubmed/37745659
http://dx.doi.org/10.3389/fneur.2023.1222721

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10512954/
https://www.ncbi.nlm.nih.gov/pubmed/37745659
http://dx.doi.org/10.3389/fneur.2023.1222721

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