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Electroencephalography characteristics related to risk of sudden unexpected death in epilepsy in patients with Dravet syndrome
OBJECTIVE: To investigate the quantitative electroencephalography (EEG) features associated with a high risk of sudden unexpected death in epilepsy (SUDEP) in patients with Dravet syndrome (DS). METHODS: Patients with DS and healthy controls (HCs) who underwent EEG were included in the study. EEG si...
Autores principales: | Kim, Jeong-Youn, Shin, Jeongyoon, Kim, Laehyun, Kim, Se Hee |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Frontiers Media S.A.
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10512954/ https://www.ncbi.nlm.nih.gov/pubmed/37745659 http://dx.doi.org/10.3389/fneur.2023.1222721 |
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