Addressing the Impact of Surface Roughness on Epsilon-Near-Zero Silicon Carbide Substrates

[Image: see text] Epsilon-near-zero (ENZ) media have been very actively investigated due to their unconventional wave phenomena and strengthened nonlinear response. However, the technological impact of ENZ media will be determined by the quality of realistic ENZ materials, including material loss an...

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Detalles Bibliográficos
Autores principales: Navajas, David, Pérez-Escudero, José M., Martínez-Hernández, María Elena, Goicoechea, Javier, Liberal, Iñigo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10515697/
https://www.ncbi.nlm.nih.gov/pubmed/37743935
http://dx.doi.org/10.1021/acsphotonics.3c00476

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10515697/
https://www.ncbi.nlm.nih.gov/pubmed/37743935
http://dx.doi.org/10.1021/acsphotonics.3c00476

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